
7
AT77C101B
2150A–BIOM–02/02
Table 3. Resistance
Parameter Min Value Standard Method
ESD
On pins. HBM (Human Body Model) CMOS I/O 2 kV MIL-STD-883- method 3015.7
On die surface (Zapgun)
Air discharge ±16 kV NF EN 6100-4-2
MECHANICAL ABRASION
Number of cycles without lubricant multiply by a factor of 20 for
correlation with a real finger
200 000 MIL E 12397B
CHEMICAL RESISTANCE
Cleaning agent, acid, grease, alcohol, diluted acetone 4 hours Internal method
Table 4. Specifications
Explanation Of Test Levels
I 100% production tested at +25°C
II 100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample)
III Sample tested only
IV Parameter is guaranteed by design and/or characterization testing
V Parameter is a typical value only
VI 100% production tested at temperature extremes
D 100% probe tested on wafer at T
amb
= +25°C
Parameter Test Level Min Typ Max Unit
Resolution IV 50 µm
Size IV 8x280 pixel
Yield: number of bad pixels I 15 bad pixels
Equivalent resistance on TPP pin I 23 30 47 Ω
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